Dr. Nathan Blattau, Vice President and Chief Scientist at DfR Solutions, will present "Thermo-mechanical Fatigue Testing of Printed Circuit Card Assemblies Using Power Cycling" at the annual IEEE ASTR (Accelerated Stress Testing and Reliability) 2009 Workshop in Jersey City, NJ on Thursday, October 8th.
Check out the workshop at:
http://www.ewh.ieee.org/soc/cpmt/tc7/ast2009/
Check back here after the event for a recap and complete presentation details.
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