Saturday, October 9, 2010

DfR Solutions at the IEC 2010 Technical Committee 107 Meeting in Seattle, WA; October 12

Ed Wyrwas has been invited to present to the IEC Technical Committee regarding his work on physics-of- failure based reliability and durability modeling of current and future generations of integrated circuits. For more information on DfR's ability to eliminate the current empirical approach to reliability prediction, contact Ed Wyrwas,

No comments:

Post a Comment