Wednesday, May 4, 2011

Austin Electronic Equipment Reliability & Testing Seminar: May 24th

May 24, 2011
1:00 - 4:30 CDT
MET Austin

There is no charge for this seminar.

See the Agenda and Register

MET Laboratories and partner DfR Solutions will co-present for an afternoon of informative seminars:

I. Test Plan Development
Test plans require sufficient stresses to bring out
real design deficiencies or defects without inducing
non-representative failures. Learn how to develop a
test plan for:

  • Industrial controls
  • Process monitoring
  • Consumer appliances
  • Telecom (Class I, II, and III environments)
  • Personal computers
  • Mobile phones and other mobile products
  • Avionics (engine controls, fuselage)
  • Automotive (under-hood, passenger compartment, chassis, and trunk)
  • Down-hole oil-drilling
II. The new test methodology for Radiated Emissions Testing (above 1GHz) to EN55022:2006+A1:2007 (Information Technology Equipment- Radio Disturbance Characteristics- Limits and Methods of Measurement). Previous versions of EN55022 did not require radiated emission testing above 1GHz. This new version of EN55022 specifies REE testing up to 6 GHz. Test methodology is also significantly different from FCC/ANSI C63.4 requirements. The new version requires testing to be done using a validated test site (chamber) according to CISPR 16-1-4. This session will cover the changes in the new version with a special emphasis on free space emissions requirements.

III. The Synergy Between Reliability and Safety in IT Equipment Regulatory, business and public constraints require a thorough understanding of the physics of how electronics fail and the tools and methodologies available to meet all customer expectations. This session will use the experience of industry experts and lessons learned to provide guidance on how the selection and control of design, materials, and processes to ensure an optimum level of product reliability also positively impacts safety.

IV. Quality, Reliability & Durability for Industrial Applications This presentation will describe a process that can be followed by the design engineer to ascertain the impacts of the operational and environmental stresses over the life cycle of a product. Examples will be shown of how the effects of thermal cycling, shock and vibration affect the solder joint fatigue, PTH fatigue, CAF resistance and overall reliability.

Plus MET will provide a hands-on demonstration in the 10m chamber for EMC troubleshooting!

MET Laboratories' electro-magnetic compatibility (EMC) laboratory has extensive experience in testing a wide range of commerical and military equipment for the domestic and global marketplace.

DfR Solutions is world-renowned for its expertise in applying the science of Reliability Physics to electrical and electronics technologies, and the company is a leading provider of quality, reliability, and durability (QRD) research and consulting for the electronics industry.

See the Agenda and Register

Directions to MET Austin:
35N or 35S
Parmer Exit
East on Parmer
Left at 1st light on McCallen Pass
Go pass big Dell building on right (13301 B)
Next building on right is MET (13301)

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