Monday, March 14, 2011

DfR Assessment of Integrated Circuit Wearout Published by IEEE

Recognizing DfR's ground-breaking tool for the prediction of integrated circuit reliability and wearout, collaboratively developed with AVSI and Professor Yosef Bernstein, IEEE Instrumentation and Measurement magazine has published Ed Wyrwas' article, "Quantitatively Analyzing the Performance of Integrated Circuits and Their Reliability." For more information on this topic and how your future designs will require this type of analysis, contact Ed Wyrwas,

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