Monday, June 13, 2011
AVSI Selects DfR Solutions for 45nm Solution
DfR is proud to announce that it has been selected by the leading avionics consortium, AVSI, to expand its revolutionary physics-of-failure based integrated circuit reliability prediction tool into 65nm and 45nm technologies. Using algorithms developed by Prof. Joey Bernstein, this tool will allow OEMs to accurately predict the behavior of current generation technology specific to their use environment, without having to wait years for industry-gathered field data of questionable origins. For more information, please contact Ed Wyrwas, firstname.lastname@example.org.