Showing posts with label accelerated stress testing. Show all posts
Showing posts with label accelerated stress testing. Show all posts
Tuesday, June 14, 2011
DfR to present "How to Accelerate Automotive Product Development " Webinar on June 30
Jim McLeish will present a webinar entitled "How to Accelerate Automotive Product Development." Registration is now open. For more information, contact Jim McLeish, jmcleish@dfrsolutions.com.
Friday, April 1, 2011
Toughest Test Program...EVER
DfR can't take the credit for these laptop tests, but our engineers are equally creative when it comes to developing viable test plans for assessing the reliability of our customer's products. Looking for assistance in developing design verification, product qualification, accelerated life tests, or environmental stress screens? Please contact Cheryl Tulkoff, ctulkoff@dfrsolutions.com |
Wednesday, February 23, 2011
Beyond Bearing Wearout: Solving Fan Reliability
Fans continue to be a liability in the long-term reliability of electronic systems. To address this risk, DfR has developed an accelerated test methodology that is a singular solution for electronic OEMs attempting to select fan suppliers or attempting to determine the root-cause of field failures. By subjecting fans to conditions more applicable to application environment, their true capability and performance can be assessed in a fraction of the time. For more information, contact Tom Johnston. |
Thursday, September 23, 2010
2010 IEEE Workshop on Accelerated Stress Testing & Reliability (ASTR): Oct 6-8 in Denver
2010 IEEE Workshop on Accelerated Stress Testing & Reliability
“Bridging the Gap between the Test Lab and Field Failures”
October 6 – 8, 2010
Denver , CO
ASTR 2010 will provide a forum to bridge gaps in knowledge and share ideas that address intra and inter industry endeavors to limit and eliminate field failures of products. The focus will be on rapidly finding design weaknesses, developing robust systems, and improving strategies to cost effectively screen defects and weaknesses in electronic and electro-mechanical hardware and structural systems while reconciling twin needs of obtaining high product quality and reliability with that of low product development and manufacturing costs and timely introduction of new products to market.
Click here for the complete event schedule.
This is always a great, informative event!
“Bridging the Gap between the Test Lab and Field Failures”
October 6 – 8, 2010
Denver , CO
ASTR 2010 will provide a forum to bridge gaps in knowledge and share ideas that address intra and inter industry endeavors to limit and eliminate field failures of products. The focus will be on rapidly finding design weaknesses, developing robust systems, and improving strategies to cost effectively screen defects and weaknesses in electronic and electro-mechanical hardware and structural systems while reconciling twin needs of obtaining high product quality and reliability with that of low product development and manufacturing costs and timely introduction of new products to market.
Click here for the complete event schedule.
This is always a great, informative event!
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