ESD to the MAX!

NASA has released some stunning photos of lightning, a common source of electrical overstress / electrostatic discharge (EOS/ESD). Although these pictures are extreme, electronics are often damaged or degraded as a result of ESD. DfR has extensive experience in mitigating ESD. Let us show you how to Design for ESD. For more information, please contact Cheryl Tulkoff, ctulkoff@dfrsolutions.com.

Upcoming DfR Joint Webinar: ESD Damage - The Surprisingly Dominant Failure Mechanism!

DfR Solutions, in association with Dangelmayer Associates, is proud to announce the Electrostatic Discharge: The Surprisingly Dominant Failure Mechanism webinar, to be held on October 21, 2010, from 2:00 p.m. to 3:15 p.m. Eastern Daylight Time.

While most companies are acutely aware of the hazards of electrostatic discharge (ESD), few are aware of just how pervasive ESD failures actually are. Recent studies into the misdiagnosis of these failures suggest that ESD damage may, in fact, be a dominant failure mechanism on the factory floor and in the field. Attend this joint webinar to learn the latest facts about ESD damage, failure analysis, and design-related ESD damage prevention techniques.

Dangelmayer Associates offers a full range of customized ESD/EOS (Electrostatic Program Management/Electrical Over Stress) professional consulting services on a Global basis for both product design and manufacturing, including but not limited to S20.20 Programs, Class 0, CDM, Charged Board Events, S20.20, EOS and Cleanrooms.

Course Outline
Introduction to Dangelmayer Associates, DfR Solutions and Speakers

EOS and ESD Impact and Roadmap, Devide Sensitivities and Procedures (Industry Council)
Defect analysis pareto
EOS and ESD dominance

ESD Models - Brief Background and Overview
Event characteristics - comparing energy/power/risetime
Human Body Model (HBM), Charged Device Model (CDM), Electrical Overstress (EOS) differentiation
Board and assembly level models
Charged board event (CBE)
Cable discharge event (CDE)

EOS Diagnosis and Misdiagnosis - Case Studies
How did they come to this determination?
Failure analysis tools typicall used for EOS/ESD/EOL
Other similar failures that are commonly mischaracterized

Damage Prevention Techniques
Design solutions
IC level protection strategies
Board-level (off chip) design solutions
Manufacturing solutions
CDM techniques
CDE techniques
EOS techiques


Cost
The cost to attend the webinar is $75. A Professional Development Hours certificate is available for an additional fee of $25. Please click here to purchase.

All presentations require the use of Adobe Flash Player to view.

Charged Board Events (CBE) Often Mistaken for Electrical Overstress (EOS)

I attended this CenTex ESDA presentation several weeks ago and found the presentation very eye opening.

"The speaker was Terry Welsher who explained his company's philosophy, reviewed ESD test procedures, provided a background of "Charged Board Events" (CBE), and explained how CBE is often mistaken for Electrical Over Stress. He showed how a CBE waveform is similar to the ESD Charged Device Model waveform, presented the CBE test results and damage, leading to the Industrial Standard/Best Practices status. His presentation generated intriguing discussion among the attendees. "

A link to Dangelmayer's publicly available version of the material can be reviewed here.