Central Texas Electronics Association
Electronics Symposium Hosted
by Cerium Labs
Wednesday, June 13, 2012
In Spansion Auditorium, 5301 E. Oltorf past Memory Lane
Program:
2:00 - Registration Begins
2:30 - Welcome and
Introductions
2:35 - “Cerium Labs
Story: From AMD Until Now,” Tim Hossain, Chief Scientist, Cerium
Labs
3:05 - “Transmission Electron
Microscopy Overview,” Lynette Ballast, Ops Director, Cerium Labs
3:35 - “Physics of
Failure,” Cheryl Tulkoff, Senior Member of Technical Staff,
DfR Solutions
4:05 - Break & Networking
4:20 - “Practical Applications
for the DCM 3D,”
Bill Henderson, Metrology
Specialist, Leica Microsystems
4:50 - “Oxide Thickness
Measurement and Solderability Methodology to Determine Long Term
Storage Compatibility of BGAs and QFPs,”
Rama
Hegde, Senior Member of Technical Staff, Freescale Semiconductor
5:20 - “Materials Imaging
Techniques,” Bob Cowden, Imaging Specialist, Leica
Microsystems
5:50 - Preview of System Demos
and Sample Evaluations Event, Mark Sekulich, McBain Systems
6:00 - Food & Refreshments
Served and More Networking
There is no charge for this event as is being sponsored by Cerium Labs
& McBain Systems
Event Location:
Hosted by Cerium Labs in Spansion Auditorium at
5301 East Oltorf St, Austin, Texas
(Enter parking lots off Oltorf just past Memory
Lane or just past Alvin Devane)
See Map at: ( Map to Cerium Labs )
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