ICICDT2012 Conference EARLY REGISTRATION ENDS April 30th, 2012
ICICDT2012 conference will be held at Freescale in Austin, TX from May 30th – June 1st 2012.
On the first day of ICICDT, four cutting-edge tutorials from industry leaders allow attendees to gain an in-depth understanding of critical issues in technology, circuit, and architecture design. Variability in device and circuit parameters adversely affects the performance, energy efficiency, and reliability of integrated circuit products across all market segments, ranging from large multi-core servers to small embedded designs in a system-on-chip (SoC). Aligned with the goal of ICICDT, the tutorial program focuses on the interaction between the technology, circuit, and architecture levels to enable robust and variation-tolerant systems.
The tutorial program opens with a presentation on advanced transistor technology by Dr. Andy Wei of GLOBALFOUNDRIES. This tutorial describes the recent advancements of non-planar multi-gate transistors to enhance electrostatics while reducing variations to enable future device scaling. In particular, this presentation highlights the key challenges and design tradeoffs for performance, power, and SoC integration. The second tutorial by Dr. Vijay Reddy of Texas Instruments focuses on transistor aging from bias temperature instability (BTI). This presentation reviews the basic transistor reliability physics and evaluates the impact of transistor aging on circuits and SoC products. The third tutorial by Prof. Chris Kim of the University of Minnesota presents circuit-level design techniques to mitigate the impact of transistor aging on circuit performance and power. These techniques include on-chip reliability monitors, memory yield enhancement circuits, and advances in CAD. The tutorial program concludes with a presentation on hardware and software co-design for variation-tolerant systems by Prof. Vijay Janapa Reddi of the University of Texas. This presentation provides a system-level perspective of the opportunities from hardware and software interactions to enhance performance and energy efficiency while maintaining historically high reliability standards at low costs.
Please go to this link for the full conference program and registration information. http://www.icicdt.org/
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